Static information storage and retrieval – Systems using particular element – Amorphous
Reexamination Certificate
2011-02-01
2011-02-01
Phung, Anh (Department: 2824)
Static information storage and retrieval
Systems using particular element
Amorphous
C365S148000
Reexamination Certificate
active
07881102
ABSTRACT:
A phase change memory includes a memory cell with a phase change element storing data according to level change of a resistance value in association with phase change, a write circuit converting the phase change element to an amorphous state or a polycrystalline state according to the logic of write data in a write operation mode, a read circuit reading out stored data from the phase change element in a readout operation mode, and a discharge circuit applying a discharge voltage to the phase change element to remove electrons trapped in the phase change element in a discharge operation mode. Accordingly, variation in the resistance value at the phase change element can be suppressed.
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Gill et al., “Ovonic Unified Memory—A High-Performance Nonvolatile Memory Technology for Stand-Alone Memory and Embedded Applications,” 2002 IEEE International Solid-State Circuits Conference, Digest of Technical Papers, pp. 202-203.
Iida Yoshikazu
Nitta Fumihiko
Yamaki Takashi
McDermott Will & Emery LLP
Phung Anh
Renesas Electronics Corporation
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