Semiconductor device including metal-insulator-metal...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S532000, C257SE29343, C438S253000, C438S387000, C438S396000

Reexamination Certificate

active

08049263

ABSTRACT:
A capacitor has an MIM (Metal Insulator Metal) structure comprising a lower electrode formed in the interior of an electrode trench which is formed in an interlayer insulating film, a dielectric film formed over the lower electrode, and an upper electrode formed over the dielectric film. The upper electrode and the dielectric film are each formed with an area larger than the area of the lower electrode so that the whole of the lower electrode is positioned inside the upper electrode and the dielectric film. The reliability and production yield of the capacitor are improved.

REFERENCES:
patent: 6180976 (2001-01-01), Roy
patent: 6524905 (2003-02-01), Yamamichi et al.
patent: 2004/0099897 (2004-05-01), Tsutsue et al.
patent: 2003-258107 (2003-09-01), None
patent: 2004-119461 (2004-04-01), None
patent: 2004-146814 (2004-05-01), None
patent: 2004-247520 (2004-09-01), None
patent: 2004-253481 (2004-09-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device including metal-insulator-metal... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device including metal-insulator-metal..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device including metal-insulator-metal... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4304230

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.