Semiconductor device including gate stack formed on inclined...

Active solid-state devices (e.g. – transistors – solid-state diode – Physical configuration of semiconductor – With specified crystal plane or axis

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S628000, C257S409000, C257SE29004, C257SE29136, C257SE29201

Reexamination Certificate

active

07667300

ABSTRACT:
A semiconductor device includes a transistor. The transistor includes a substrate having an inclined surface, a first upper surface extending from a lower portion of the inclined surface, and a second upper surface extending from an upper end of the inclined surface. A gate stack structure is formed on the inclined surface and includes a gate electrode. A first impurity region formed on one of the first and second upper surfaces contacts the gate stack structure. A second impurity region formed on the second upper surface contacts the gate stack structure. A channel between the first and second impurity regions is formed along the inclined surface in a crystalline direction.

REFERENCES:
patent: 6670694 (2003-12-01), Momose
patent: 2006/0049430 (2006-03-01), Kasai et al.
M. Yang et al. “High Performance CMOS Fabricated o Hybrid Substrate With Different Crystal Orientations”. 2003.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device including gate stack formed on inclined... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device including gate stack formed on inclined..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device including gate stack formed on inclined... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4184506

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.