Semiconductor device including fuse and method for testing...

Details Semiconductor device including fuse and method for testing... Semiconductor device including fuse and method for testing...

2008-05-20

2008-05-20

Lam, David (Department: 2827)

Static information storage and retrieval

Read/write circuit

Having fuse element

C365S201000, C365S096000, C365S100000

Reexamination Certificate

active

07376036

ABSTRACT:
In a method for testing whether or not a fuse on a semiconductor substrate is disconnected, a first test operation is performed upon the fuse by determining whether or not a resistance value of the fuse is larger than a first threshold resistance value. Then, a second test operation is performed upon the fuse by determining whether or not a resistance value of the fuse is larger than a second threshold resistance value smaller than the first threshold resistance value.

REFERENCES:
patent: 6781900 (2004-08-01), Furutani et al.
patent: 7030641 (2006-04-01), Tang et al.
patent: 7054180 (2006-05-01), Schamberger et al.
patent: 7136322 (2006-11-01), Brennan et al.
patent: 06-140510 (1994-05-01), None

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