Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics
Reexamination Certificate
2009-07-14
2011-10-25
Luu, Chuong A. (Department: 2892)
Active solid-state devices (e.g., transistors, solid-state diode
Integrated circuit structure with electrically isolated...
Passive components in ics
C257S209000, C257S528000, C257S530000
Reexamination Certificate
active
08044490
ABSTRACT:
Provided is a semiconductor device including a fuse, in which a insulating layer surrounding the fuse or metal wiring is prevented from being damaged due to the cut of a fuse, which can occur when a repair process is performed. The semiconductor device includes a conductive line formed on a semiconductor layer, a protective layer formed on the conductive line, one or more fuses that are electrically connected to the conductive line, and a fuse protective layer formed on the one or more fuses, and spaced apart from the protective layer.
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patent: 7589363 (2009-09-01), Cheng et al.
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Choi Gil-heyun
Lee Jong-myeong
Park Byung-lyul
Shin Seung-woo
Yun Jong-ho
F. Chau & Associates LLC
Luu Chuong A.
Samsung Electronics Co,. Ltd.
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