Semiconductor device including complementary data bus pair

Static information storage and retrieval – Read/write circuit – Flip-flop used for sensing

Reexamination Certificate

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C365S189080

Reexamination Certificate

active

06414891

ABSTRACT:

BACKGROUND OF THE INVENTION
1. Field of the Invention
The present invention relates to semiconductor devices, and particularly to a semiconductor device that transfers data using complementary data buses.
2. Description of the Background Art
A synchronous dynamic random access memory of a double data rate (DDR-SDRAM) is conventionally known as an example of a synchronous type semiconductor memory device. This semiconductor memory device reads out data in units of one column block each. More specifically, data of two bits (called even-numbered address data and odd-numbered address data) is read out by accessing the region whose least significant bit CA
0
of the column address is 0 (region of an even-numbered address) and the region whose least significant bit CA
0
of the column address is 1 (region of an odd-numbered address) at the same time.
These semiconductor memory devices employ the complementary data bus structure as the bus to transfer the data read out for the purpose of reducing power consumption and improving the speed.
A conventional semiconductor memory device will be described with reference to FIG.
8
. Referring to
FIG. 8
, a semiconductor memory device
9000
includes a pair of complementary data buses DB, DB#, a memory cell array
900
, a row related control circuit
901
performing a row select operation of memory cell array
900
, a column related control circuit
902
performing a column select operation of memory cell array
900
, a driver unit
903
, a clock buffer
904
receiving external clocks extCLK and extCLK# complementary to each other, and an internal clock signal generation circuit (DLL: Delayed Locked Loop)
905
receiving the output of clock buffer
904
to generate an internal clock.
Memory cell array
900
includes a plurality of memory cells arranged in a matrix, a plurality of word lines arranged corresponding to a plurality of rows, and a plurality of bit lines arranged corresponding to a plurality of columns. Memory cell array
900
is divided into a block B
0
of an even-numbered address, and a block B
1
of an odd-numbered address. In the drawing, a word line WL, bit lines BL
00
, BL
01
, a memory cell M
0
of block B
0
connected to word line WL, and a memory cell M
1
of block B
1
connected to word line WL are depicted representatively. Even-numbered address data Even designates data read out from block B
0
whereas odd-numbered address data Odd designates data read out from block B
1
.
Row related control circuit
901
renders a corresponding word line active according to an address signal. Column related control circuit
902
outputs the data on the selected bit line (readout data) according to an address signal.
Driver unit
903
receives readout data output from column related control circuit
902
to provide the readout data and data that is complementary to the readout data to data buses DB and DB#, respectively.
Semiconductor memory device
9000
further includes a receiver
906
to receive even-numbered address data Even from complementary data bus pair DB, DB#, a receiver
907
receiving odd-numbered address data Odd from complementary data bus pair DB, DB#, an output register
908
receiving and providing to a data input/output terminal DQ the output of receiver
906
according to an internal clock signal intCLKD output from internal clock signal generation circuit
905
, and an output register
909
receiving and providing to data input/output terminal DQ the output of receiver
907
according to an inverted signal of internal clock signal intCLKD.
The relationship between complementary data bus pair DB, DB# and the receivers of conventional semiconductor memory device
9000
will be described here with reference to FIG.
9
.
An equalize circuit T to equalize data buses DB and DB# is located between data bus DB and data bus DB#. In
FIG. 9
, a transistor T connected between data bus DB and data bus DB# is depicted as an example of equalize circuit T.
Transistor T receives an equalize signal EQ at its gate. An equalize operation is executed when equalize signal EQ attains an H level, whereby data buses DB and DB# are electrically connected.
Receiver
906
includes an amplifier
910
for the even-numbered address. Amplifier
910
responds to an amplifier activation signal SE of an activated state to amplify the potential difference between data buses DB and DB# for output.
Receiver
907
includes an amplifier
911
for the odd-numbered address. Amplifier
911
responds to amplifier activation signal SE of an active state to amplify the potential difference between data buses DB and DB# for output.
Amplifier activation signal SE is opposite in phase to equalize signal EQ, and is rendered active during the period an equalize operation is suppressed.
A readout operation of semiconductor memory device
9000
will be described with reference to FIG.
10
. Equalize signal EQ is at an H level (active state). Data buses DB and DB# are equalized by the equalize circuit.
Even-numbered address data Even and odd-numbered address data Odd that are the subject of readout are selected. Then, equalize signal EQ is driven to an L level. First, even-numbered address data Even is transmitted onto complementary data bus pair DB, DB#. Amplifier activation signal SE attains an H level, whereby the potential difference between data buses DB and DB# is amplified in amplifier
910
.
For the subsequent data transfer, equalize signal EQ is driven to an H level. The pair of complementary data buses DB, DB# are equalized.
Then, equalize signal EQ is pulled down to an L level. Odd-numbered address data Odd is transmitted onto complementary data bus pair DB, DB#. Amplifier activation signal SE is driven to an H level, whereby the potential difference between data buses DB and DB# is amplified in amplifier
911
.
For the subsequent read/write operation, equalize signal EQ is driven to an H level again.
According to the above-described structure of conventional semiconductor memory device
9000
, the complementary data bus pair must always be equalized after data is output to the complementary data bus pair in reading out data continuously.
Therefore, the time for equalization cannot be reduced. More specifically, there was a problem that the chip could not be operated at 143 MHz or above.
An approach can be considered to provide a complementary data bus pair corresponding to respective even-numbered address data and odd-numbered address data to solve this problem. However, the chip size will be increased with the above-described structure.
Furthermore, it is difficult to obtain data of sufficient amplitude at the reception side (receiver side) as the chip size is increased and the data bus becomes longer. This reduction in data amplitude prevents high speed operation.
SUMMARY OF THE INVENTION
In view of the foregoing, an object of the present invention is to provide a semiconductor device that can transfer data speedily and reliably.
According to an aspect of the present invention, a semiconductor device includes a memory cell array with a plurality of memory cells, a data bus pair of a first data bus and a second data bus transmitting data complementary to each other, a read circuit reading out n (n is an integer of at least 2) storage data out of a plurality of storage data stored in a plurality of memory cells and providing n storage data continuously to the data bus pair in a data readout operation, a plurality of output circuits provided corresponding to n storage data, respectively, each sensing potential difference between the first and second data buses to amplify the sensed potential difference for output, and a data transfer processing circuit arranged between the data bus pair and the plurality of output circuits for the plurality of output circuits to continuously receive corresponding storage data alternately.
Preferably, each of the plurality of output circuits includes a circuit amplifying the potential difference between a first node whose voltage level changes acco

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