Static information storage and retrieval – Read/write circuit – Having fuse element
Reexamination Certificate
2011-05-31
2011-05-31
Hoang, Huan (Department: 2827)
Static information storage and retrieval
Read/write circuit
Having fuse element
C365S200000, C365S201000
Reexamination Certificate
active
07952950
ABSTRACT:
An anti-fuse circuit according to the present invention includes an anti-fuse element that holds data in a nonvolatile manner and a latch circuit that temporarily holds data to be written to the anti-fuse element. The writing to the latch circuit can be performed in the order of nanoseconds, and thus, even when the defective addresses respectively different are written in a plurality of chips, a writing process to the latch circuit can be completed in a very short period of time. Thereby, an actual process for writing to the anti-fuse element can be performed in parallel for the chips, and as a result, the process for writing to the anti-fuse element can be performed at high speed.
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Miyatake Shin-ichi
Ogawa Sumio
Elpida Memory Inc.
Hoang Huan
McGinn IP Law Group PLLC
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