Semiconductor device manufacturing: process – Formation of electrically isolated lateral semiconductive... – Total dielectric isolation
Reexamination Certificate
2006-09-12
2009-06-02
Coleman, W. David (Department: 2823)
Semiconductor device manufacturing: process
Formation of electrically isolated lateral semiconductive...
Total dielectric isolation
C438S458000, C257SE21568
Reexamination Certificate
active
07541257
ABSTRACT:
A semiconductor device includes: a silicon substrate; and a silicon oxide film disposed on the silicon substrate. The silicon oxide film includes a part, which separates from a surface of the silicon substrate, so that the silicon oxide film provides a three-dimensional construction. By using the three-dimensional construction, an additional function such as a resistor or a capacitor is easily added in the device. Further, a manufacturing method of this three-dimensional construction is simple and has a low cost.
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Office Action dated Aug. 31, 2007 in corresponding German Patent Application No. 10 2006 043 360.2-33 (and English translation).
Aoki Takaaki
Ishikawa Eiji
Coleman W. David
DENSO CORPORATION
Posz Law Group , PLC
Scarlett Shaka
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