Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2008-12-16
2010-12-28
Purvis, Sue (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE29262
Reexamination Certificate
active
07859048
ABSTRACT:
A semiconductor device includes: a first semiconductor layer; a PN column layer having first and second column layers; and a second semiconductor layer. Each of the first and second column layers includes first and second columns alternately arranged along with a horizontal direction. The first and second column layers respectively have first and second impurity amount differences defined at a predetermined depth by subtracting an impurity amount in the second column from an impurity amount in the first column. The first impurity amount difference is constant and positive. The second impurity amount difference is constant and negative.
REFERENCES:
patent: 2007/0177444 (2007-08-01), Miyajima
patent: 2008/0017897 (2008-01-01), Saito et al.
patent: A-2004-72068 (2004-03-01), None
Office Action dated Oct. 23, 2009 in the corresponding Chinese patent application No. 2008101856536 (English translation enclosed).
Kagata Yuma
Sakakibara Jun
Yamaguchi Hitoshi
Denso Corporation
Kuo W. Wendy
Posz Law Group , PLC
Purvis Sue
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