Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-04-12
2011-04-12
Geyer, Scott B (Department: 2812)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S401000, C438S270000, C438S589000
Reexamination Certificate
active
07923784
ABSTRACT:
A semiconductor device includes a semiconductor substrate with an isolation layer formed in the semiconductor substrate to delimit active regions. Recess patterns for gates are defined in the active regions and the isolation layer. Gate patterns are formed in and over the recess patterns for gates, and a gate spacer is formed to cover the gate patterns. The recess patterns for gates have a first depth in the active regions and a second depth, which is greater than the first depth, in the isolation layer. Gaps are created between the gate patterns and upper parts of the recess patterns for gates that are defined in the isolation layer. The gate spacer fills the gaps and protects the gate spacer so as to prevent bridging.
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Chae Kwang Kee
Lee Jae Kyun
Yu Jae Seon
Geyer Scott B
Hynix / Semiconductor Inc.
Ladas & Parry LLP
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