Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2005-08-02
2005-08-02
Pham, Hoai (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S378000
Reexamination Certificate
active
06924534
ABSTRACT:
The invention is directed to reducing of the number of steps in a BiCMOS process. A first N-well3A and a second N-well3B are formed deeply on a surface of a P-type semiconductor substrate. A first P-well4A is formed in the first N-well3A, and an N-channel MOS transistor is formed in the first P-well4A. The second N-well3B is used as a collector of a vertical NPN bipolar transistor. A second P-well4B is formed in the second N-well3B. The second P-well4B is formed simultaneously with the first P-well4A. The second P-well4B is used as a base of the vertical NPN bipolar transistor. An N+ emitter layer and a P+ base electrode layer of the vertical NPN bipolar transistor are formed on a surface of the second P-well4B.
REFERENCES:
patent: 6649983 (2003-11-01), Chatterjee
Goshima Kazutomo
Ohkoda Toshiyuki
Taniguchi Toshimitsu
Morrison & Foerster / LLP
Pham Hoai
Sanyo Electric Co,. Ltd.
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