Semiconductor device having low interface state density and...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S410000, C257S406000

Reexamination Certificate

active

06949805

ABSTRACT:
The semiconductor device comprises an intermediate layer formed on a semiconductor substrate6, the intermediate layer12being formed of an oxide containing a first element which is either of a III group element and a V group element, an insulation film formed on the intermediate layer, the insulation film being formed of an oxide of a second element which is the other of the III group element and the V group element, and an electrode16formed on the insulation film. Because the intermediate layer of the oxide containing the first element is formed, even when the gate insulation film is formed of Al2O3or others, the interface state density can be depressed to be low. Thus, the semiconductor device can have low interface state density and small flat band voltage shift even when Al2O3, etc. is used as a material of the insulation film.

REFERENCES:
patent: 6013553 (2000-01-01), Wallace et al.
patent: 6200891 (2001-03-01), Jagannathan et al.
patent: 6844604 (2005-01-01), Lee et al.
patent: 2002/0153579 (2002-10-01), Yamamoto
patent: 2004/0084736 (2004-05-01), Harada

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