Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-10-31
2006-10-31
Siek, Vuthe (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07131075
ABSTRACT:
A semiconductor device has a circuit element having a given value of a characteristic property. The circuit element has at least two individual elements, each having an individual value for the characteristic value thereof, the individual values including an error portion that is substantially statistically uncorrelated, the individual elements disposed solely for contributing to the values of the characteristic property.
REFERENCES:
patent: 6129459 (2000-10-01), Kishimoto et al.
patent: 6347393 (2002-02-01), Alpert et al.
patent: 6519748 (2003-02-01), Sakamoto
patent: 6583495 (2003-06-01), Lee et al.
patent: 6732065 (2004-05-01), Muddu
patent: 6880134 (2005-04-01), Drennan
Mack Paul
Siek Vuthe
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