Semiconductor device having contact failure detector

Details Semiconductor device having contact failure detector Semiconductor device having contact failure detector

2008-07-24

2009-11-24

Nguyen, Ha Tran T (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S713000, C324S765010, C324S1540PB

Reexamination Certificate

active

07622940

ABSTRACT:
A semiconductor device having a circuit for detecting a defective connection to the semiconductor device. A semiconductor device including multiple internal circuits; multiple pads respectively connected to the internal circuits; and a contact failure detector coupled between the pads and a common node and configured to detect contact failures between tips of a probe card and the pads.

REFERENCES:
patent: 3783375 (1974-01-01), Bennett
patent: 3867693 (1975-02-01), Saxenmeyer, Sr.
patent: 4342958 (1982-08-01), Russell
patent: 5962868 (1999-10-01), Tanida
patent: 7474106 (2009-01-01), Kanno
patent: 2002/0145440 (2002-10-01), Ohya et al.
patent: 2001-050996 (2001-02-01), None
patent: 2004-119774 (2004-04-01), None
patent: 10-0666176 (2007-01-01), None
English language abstract of Japanese Publication No. 2001-050996.
English language abstract of Japanese Publication No. 2004-119774.
English language abstract of Korean Publication No. 10-0666176.

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