Semiconductor device having contact check circuit

Details Semiconductor device having contact check circuit Semiconductor device having contact check circuit

1998-02-03

1999-10-05

Martin-Wallace, Valencia

Active solid-state devices (e.g., transistors, solid-state diode

Test or calibration structure

257415, 324757, 324765, H01L 2358

Patent

active

059628685

ABSTRACT:
A contact check circuit of a semiconductor device includes N-channel MOS transistors connected in series between pads located at opposing ends, with their gates respectively connected to intermediate pads. At the contact check, conduction between opposing pads is checked, applying an "H" level to probes corresponding to the pads. Thus contact between the pads and probes of a semiconductor testing apparatus can be checked at once.

REFERENCES:
patent: 3781683 (1973-12-01), Freed
patent: 5652632 (1997-07-01), Shimizu

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