Semiconductor device having a tri-layer gate insulating dielectr

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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257295, 257310, H01L 2978

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active

060575840

ABSTRACT:
A semiconductor device having a gate insulating tri-layer includes a substrate, a nitrogen-containing layer disposed on the substrate, a first dielectric layer disposed over the nitrogen containing layer, a second dielectric layer disposed over the first dielectric layer, and a gate electrode disposed over the second dielectric layer. One of the first and second dielectric layers is formed using an oxide having a dielectric constant ranging from 4 to 100 and the other of the first and second dielectric layers is formed using an oxide having a higher dielectric constant ranging from 10 to 10,000.

REFERENCES:
patent: 5572052 (1996-11-01), Kashihara et al.
patent: 5834353 (1998-11-01), Wu
patent: 5963810 (1999-10-01), Gardner et al.
U.S. application No. 08/920,384, filed Aug. 29, 1997.
U.S. application No. 08/993,414, filed Dec. 18, 1997.

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