Semiconductor device having a temperature detection circuit

Details Semiconductor device having a temperature detection circuit Semiconductor device having a temperature detection circuit

1991-08-30

1994-02-08

LaRoche, Eugene R.

Static information storage and retrieval

Read/write circuit

Testing

365211, 365212, G11C 2900

Patent

active

052854183

ABSTRACT:
A semiconductor device is provided with an automatic voltage switching circuit which applies an internal, reduced power voltage to an internal other than when a burn-in test is performed. The semiconductor device comprises a temperature detection circuit for detecting a predetermined temperature used for the burn-in test and a switch circuit for applying the external power voltage to the internal circuit when the predetermined temperature is detected.

REFERENCES:
patent: 4278873 (1981-07-01), Petrides
patent: 4730228 (1988-03-01), Einzinger et al.
patent: 5119337 (1992-06-01), Shimizu et al.

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