Semiconductor device having a dual gate electrode and...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S369000, C257S351000, C257S412000, C257SE21623, C257SE21637, C257SE21027, C257SE21177, C257SE21179, C257SE21421, C257SE21632, C257SE21635, C257SE21674, C438S157000, C438S176000, C438S195000, C438S197000, C438S283000, C438S652000, C438S657000

Reexamination Certificate

active

08076729

ABSTRACT:
Disclosed is a method for forming a dual gate electrode of a semiconductor device, which may improve manufacturing productivity by simplifying a process of forming gate electrodes in PMOS and NMOS regions, respectively, and may provide improvement in performance by making the two gate electrodes have a different thickness and material state in a manner that one of the two gate electrodes has a single-layer structure and the other one has a two-layer structure.

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