Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2006-12-12
2006-12-12
Graybill, David E. (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S529000, C257S530000, C257SE23147
Reexamination Certificate
active
07148503
ABSTRACT:
The present invention provides a semiconductor device, in which a plurality of chip IPs are mounted onto a common semiconductor circuit board, an evaluation method for the same, and a function setting method for the same. Various IP groups can be mounted as chip IPs onto a silicon circuit board. The silicon circuit board includes a silicon substrate, a wiring layer and pads. IPs (chip IPs) are mounted onto the pads by lamination. Means for selecting, switching and setting the functions of the IPs are provided, making the semiconductor device suitable for small-variety mass-production.
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Fujimura Katsuya
Motohara Akira
Shiomi Kentaro
Yokoyama Toshiyuki
Graybill David E.
Matsushita Electric - Industrial Co., Ltd.
McDermott Will & Emery LLP
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