Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – Fusible link or intentional destruct circuit
Reexamination Certificate
2005-12-15
2010-02-02
Tra, Quan (Department: 2816)
Miscellaneous active electrical nonlinear devices, circuits, and
Specific identifiable device, circuit, or system
Fusible link or intentional destruct circuit
C365S200000
Reexamination Certificate
active
07656220
ABSTRACT:
Disclosed are a semiconductor device capable of reducing the number of program fuses used therein, and a fuse circuit selection method capable of reducing the number of program fuses. The semiconductor device includes: a fuse circuit (11) and an entire inversion fuse circuit (12), each of which includes plural program fuses, and which store desired addresses based on cutting patterns of the plural program fuses, wherein the fuse circuit (11) and the entire inversion fuse circuit (12) are configured to be capable of storing addresses different from each other based on the same cutting pattern. As described above, since plural types of the cutting patterns of the program fuses exist even in the same address, the fuse circuit for use is appropriately selected, thus it is made possible to reduce the number of fuse elements to be cut as a whole. Thus, manufacturing cost of the semiconductor device can be reduced, and in addition, it is made possible to enhance reliability of the semiconductor device.
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Japanese Office Action, w/ partial English translation thereof, issued in Japanese Patent Application No. JP 2004-371189 dated Feb. 3, 2009.
Kawamata Yosuke
Kitayama Makoto
Elpida Memory Inc.
McDermott Will & Emery LLP
Tra Quan
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