4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Memory testing

Yosuke Kawamata

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Memory testing apparatus and method

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor device employing fuse circuit and method for...

Miscellaneous active electrical nonlinear devices – circuits – and – Specific identifiable device – circuit – or system – Fusible link or intentional destruct circuit
Reexamination Certificate

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Semiconductor memory device including fuse detection circuit...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2705937

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