Semiconductor device comprising a contact structure based on...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C438S618000, C257SE21620, C257SE21641

Reexamination Certificate

active

07902581

ABSTRACT:
By providing contact plugs having a lower plug portion, formed on the basis of well-established tungsten-based technologies, and an upper plug portion, which may comprise a highly conductive material such as copper or a copper alloy, a significant increase in conductivity of the contact structure may be achieved. For this purpose, after the deposition of a first dielectric layer of the inter-layer stack, a planarization process may be performed so as to allow the formation of the lower plug portions on the basis of tungsten, while, after the deposition of the second dielectric layer, a corresponding copper-based technology may be used for forming the upper plug portions of significantly enhanced conductivity.

REFERENCES:
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patent: 6130449 (2000-10-01), Matsuoka et al.
patent: 6172387 (2001-01-01), Thakur et al.
patent: 6211085 (2001-04-01), Liu
patent: 6229186 (2001-05-01), Ishida
patent: 6274409 (2001-08-01), Choi
patent: 6661097 (2003-12-01), Clevenger et al.
patent: 2003/0003733 (2003-01-01), Ohashi et al.
patent: 2005/0133920 (2005-06-01), Liou et al.
patent: 2005/0277258 (2005-12-01), Huang et al.
patent: 103 05 365 (2004-08-01), None

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