Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-05-15
1997-09-09
Wieder, Kenneth A.
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
439 70, G01R 3128
Patent
active
056660642
ABSTRACT:
A semiconductor device comprises a plurality of leads respectively made up of an inner lead and an outer lead, a semiconductor chip electrically connected to the inner leads of the leads, and a package encapsulating at least the inner leads of the leads and the semiconductor chip so that the outer leads extend outwardly of the package. The package has an upper part and a lower part which have mutually different sizes such that a stepped part is formed between the upper and lower parts by the different sizes, and each of the outer leads have a wide part which is wider than other parts of the outer lead extending outwardly of the package only within the stepped part of the package.
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U.S. Ser. No. 08/455,909 May 31, 1995 Junichi Kasai et al. Fujitsu Limited.
Kasai Junichi
Mashiko Takashi
Saigo Yukio
Sakuma Masao
Takenaka Masashi
Bowser Barry C.
Fujitsu Automation Limited
Fujitsu Limited
Kyushu Fujitsu Elecronics Limited
Wieder Kenneth A.
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