Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate
2009-01-29
2011-10-18
Kerveros, James C (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Memory testing
C714S719000
Reexamination Certificate
active
08042013
ABSTRACT:
A semiconductor device includes a memory module provided with a plurality of memory cells, a verify determination unit that performs quality determination of read data that have been read from the memory cells on the basis of the read data and an expected value prepared in advance, and a power source monitoring circuit that detects fluctuations equal to or greater than a predetermined variation rate in a power source voltage supplied to the memory module and outputs a power source abnormality detection signal. Furthermore, the verify determination unit invalidates a result of the quality determination when the power source abnormality detection signal indicates an abnormal state of the power source voltage.
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Foley & Lardner LLP
Kerveros James C
Renesas Electronics Corporation
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