Semiconductor device and testing apparatus for semiconductor...

Details Semiconductor device and testing apparatus for semiconductor... Semiconductor device and testing apparatus for semiconductor...

2006-05-02

2006-05-02

Elms, Richard (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S189011, C365S189070, C365S194000

Reexamination Certificate

active

07038955

ABSTRACT:
For the purpose of providing an inexpensive memory from which test results can be certainly read out, a semiconductor device having a BIST circuit (built-in self test circuit) includes a RAM for use in processing to be tested incorporated in a data processing system, a built-in self test circuit making a built-in self test on the RAM for use in processing, and a RAM for tester storing test results of the RAM for use in processing obtained by the built-in self test circuit so that the test results can be read out by an external tester, wherein a RAM having a data read-out margin greater than a data read-out margin of the RAM for use in processing is used as the RAM for tester.

REFERENCES:
patent: 5568437 (1996-10-01), Jamal
patent: 6359818 (2002-03-01), Suzuki
patent: 6567325 (2003-05-01), Hergott
patent: 10-302499 (1998-11-01), None
patent: 11-238400 (1999-08-01), None
patent: 2002-133897 (2002-05-01), None
patent: 2002-298598 (2002-10-01), None

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