Semiconductor device and test method therefor

Details Semiconductor device and test method therefor Semiconductor device and test method therefor

2011-03-01

2011-03-01

Audong, Gene N. (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S226000, C365S230060

Reexamination Certificate

active

07898884

ABSTRACT:
Disclosed is a semiconductor device including internal power supply generating circuits for generating internal power supplies and data terminals via which data signals are output or input/output. The internal power supply monitor terminals are in common use with the data terminals. The semiconductor device also includes selection circuits for selecting, by a test control signal, whether or not output voltages of the internal power supply generating circuits are to be output to the data terminals.

REFERENCES:
patent: 6549480 (2003-04-01), Hosogane et al.
patent: 7606102 (2009-10-01), Blodgett
patent: 7660183 (2010-02-01), Ware et al.
patent: 2001/0033195 (2001-10-01), Kanda et al.
patent: 2002/0024330 (2002-02-01), Hosogane et al.
patent: 2002-74996 (2002-03-01), None
patent: 2006-179175 (2006-07-01), None

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