Static information storage and retrieval – Read/write circuit – Testing
Patent
1997-09-11
1999-07-13
Nguyen, Viet Q.
Static information storage and retrieval
Read/write circuit
Testing
36523003, 36523006, 36518905, G11C 700
Patent
active
059236000
ABSTRACT:
A semiconductor device having a multi-bit data input/output terminal is tested or inspected by use of a conventional testing apparatus. The semiconductor device is divided into a number of memory cell blocks, and test data comprised of a limited number of bits corresponding to the number of bits of the data I/O terminal of each memory cell block is supplied to each memory cell block. Each memory cell block has a buffer circuit located between adjacent ones of the data buses corresponding to the respective I/O terminals. Each memory cell block also has first to test buffer circuits. The test buffer circuits include an i-th test buffer circuit (i a natural number in the range of) which has one connected to the first data bus and the other end connected to the data bus. The first to n-th buffer circuits and the first to test buffer circuits are switched between active and inactive by controlling timing signals supplied thereto.
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Kabushiki Kaisha Toshiba
Nguyen Viet Q.
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