4. Active solid-state devices (e.g., transistors, solid-state diode
  5. Combined with electrical contact or lead
  6. Of specified material other than unalloyed aluminum

Masao Nakadaira

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Semiconductor device, and test circuit and test method for...

Data processing: measuring – calibrating – or testing – Measurement system – Weight
Reexamination Certificate

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Semiconductor integrated device

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum
Reexamination Certificate

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Spread spectrum block control apparatus and spread spectrum...

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Phase shift by less than period of input
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2689107

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