Semiconductor device and production method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

257298, 257300, 257301, 257303, 257304, 257306, 257207, 257308, 257309, 257310, 257313, H01G 406

Patent

active

060693886

ABSTRACT:
On a silicon substrate 1 is provided a silicon oxide film 2, on which a polycrystalline silicon film 3 is formed by a low pressure CVD method at a monosilane partial pressure of no more than 10 Pa and a film formation temperature of no lower than 600.degree. C. The polycrystalline silicon film is doped with an impurity such as phosphorus in a concentration of 1.times.10.sup.20 atoms/cm.sup.3 to 1.times.10.sup.21 atoms/cm.sup.3 to form a phosphosilicate glass film 6, and after removing it, the polycrystalline silicon film is thermally oxidized in an oxidative atmosphere to form a dielectric film 5 on the surface. A polycrystalline silicon film 4 is formed on the dielectric film 5, which is treated as the oriented polycrystalline silicon film 3a to form an oriented polycrystalline silicon film 4a. The oriented polycrystalline silicon film 4a as an upper electrode and the oriented polycrystalline silicon film 3a as a lower electrode are wired to obtain a semiconductor device having a capacitor. Further, a thin film transistor of a high dielectric strength can be produced in a short time on the polycrystalline silicon which is oriented in a short time.

REFERENCES:
patent: 5220482 (1993-06-01), Takemura et al.
patent: 5290729 (1994-03-01), Hayashide et al.
patent: 5420072 (1995-05-01), Fiordalice etg al.
patent: 5859683 (1999-01-01), Tagusa et al.
patent: 5880496 (1999-03-01), Chen et al.
Y. Hayashide et al., "Fabrication of Storage Capacitance-Enhanced Capacitors with a Rough Electrode", Extended Abstracts of the 22nd Conference on Solid State Devices and Meterials, pp. 869-872 (1990).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and production method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and production method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and production method thereof will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1912239

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.