Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Patent
1995-06-28
2000-06-06
Bowers, Charles
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
438142, 117 7, 117 8, H01L 2184
Patent
active
060717645
ABSTRACT:
After a pattern is transferred on silicon film crystallized by annealing, the silicon film is annealed by radiation of intense rays for a short time. Especially, in the crystallizing process by annealing, an element which promotes crystallization such as nickel is doped therein. The area not crystallized by annealing is also crystallized by radiation of intense rays and a condensed silicon film is formed.
After a metal element which promotes crystallization is doped, annealing by light for a short time is performed by radiating intense rays onto the silicon film crystallized by annealing in an atmosphere containing halide. After the surface of the silicon film is oxidized by heating or by radiating intense rays in a halogenated atmosphere and an oxide film is formed on the silicon film, the oxide film is then etched. As a result, nickel in the silicon film is removed.
REFERENCES:
patent: 4226898 (1980-10-01), Ovshinsky et al.
patent: 4231809 (1980-11-01), Schmidt
patent: 4300089 (1987-11-01), Chang
patent: 4309224 (1982-01-01), Shibata
patent: 4331709 (1982-05-01), Risch et al.
patent: 4379020 (1983-04-01), Glaeser et al.
patent: 5043224 (1991-08-01), Jaccodine et al.
patent: 5145808 (1992-09-01), Sameshima et al.
patent: 5147826 (1992-09-01), Liu et al.
patent: 5200630 (1993-04-01), Nakamura et al.
patent: 5221423 (1993-06-01), Sugino et al.
patent: 5225355 (1993-07-01), Sugino et al.
patent: 5254480 (1993-10-01), Tran
patent: 5262350 (1993-11-01), Yamazaki et al.
patent: 5262654 (1993-11-01), Yamazaki
patent: 5275851 (1994-01-01), Fonash et al.
patent: 5278093 (1994-01-01), Yonehara
patent: 5296405 (1994-03-01), Yamazaki et al.
patent: 5298075 (1994-03-01), Lagendijk
patent: 5308998 (1994-05-01), Yamazaki et al.
patent: 5313075 (1994-05-01), Zhang et al.
patent: 5352291 (1994-10-01), Zhang et al.
patent: 5366926 (1994-11-01), Mei et al.
patent: 5424230 (1995-06-01), Wakai
patent: 5550070 (1996-08-01), Funai et al.
patent: 5595944 (1997-01-01), Zhang et al.
patent: 5646424 (1997-07-01), Zhang et al.
patent: 5773846 (1998-06-01), Zhang et al.
T. Hempel, et al., Solid State Communications, vol. 85, #11, pp. 921-992 Mar. 1993, Received after Mar. 22, 1993.
A.V. Dvurechenskii et al., Phys. stat. sol., (a) 95, p. 635 (1986).
S. Takenaka et al., Jpn. J. Appl. Phys. 29(12) (1990) L2380, "High Mobility Poly-Si TFTs Using SPC a-Si Films Deposited by PECVD" Dec. 1990.
R. Kakkad et al., "Crystallized Si films by low-temperature rapid thermal annealing of amorphous silicon," J. Appl. Phys., 65(5), Mar. 1, 1989, pp. 2069-2072.
G. Liu et al., "Polycrystalline silicon thin film transistors on Corning 7059 glass substrates using short time, low-temperature processing," Appl. Phys. Lett. 62(20), May 17, 1993, pp. 2554-2556.
G. Liu et al., "Selective area crystallization of amorphous silicon films by low-temperature rapid thermal annealing," Appl. Phys. Lett. 55(7), Aug. 14, 1989, pp. 660-662.
R. Kakkad et al., "Low Temperature Selective Crystallization of Amorphous Silicon," Journal of Non-Crystalline Solids, 115, 1989, pp. 66-68.
C. Hayzelden, et al., "In situ transmission electron microscopy studies of silicide-mediated crystallization of amorphous silicon," (3 pages) J. Appl. Phys. 73(1993) 8279.
Ohnuma Hideto
Takemura Yasuhiko
Zhang Hongyong
Bowers Charles
Costellia Jeffrey L.
Ferguson Jr. Gerald J.
Semiconductor Energy Laboratory Co,. Ltd.
Sulsky Martin
LandOfFree
Semiconductor device and process for fabricating the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device and process for fabricating the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and process for fabricating the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2212408