Semiconductor device and method of manufacturing the same

Active solid-state devices (e.g. – transistors – solid-state diode – Integrated circuit structure with electrically isolated... – Passive components in ics

Reexamination Certificate

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C257S209000, C257S508000, C257S665000, C257SE23147, C257SE23149, C257SE23150, C257SE21592, C438S132000, C438S467000, C438S601000

Reexamination Certificate

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07633136

ABSTRACT:
A semiconductor device includes an interlayer insulating film on a substrate. A runner part includes a plurality of runner lines spaced apart from each other by a regular interval under the interlayer insulating film. A fuse cut part includes a plurality of fuse lines spaced apart from each other by a wider interval than the interval between the runner lines. A via in the interlayer insulating film connects a fuse line and a runner line to each other.

REFERENCES:
patent: 6172896 (2001-01-01), Lee
patent: 6531757 (2003-03-01), Shiratake
patent: 6541290 (2003-04-01), Bang et al.
patent: 6597054 (2003-07-01), Prall et al.
patent: 6822309 (2004-11-01), Hirota
patent: 7057217 (2006-06-01), Kang et al.
patent: 7361967 (2008-04-01), Takahashi et al.
patent: 2004/0140501 (2004-07-01), Kim
patent: 2000-357873 (2000-12-01), None
patent: 2002-151593 (2002-05-01), None
patent: 2005-032916 (2005-02-01), None
English language abstract for Japanese Publication No. 2002-151593.
English language abstract for Japanese Publication No. 2005-032916.

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