Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2004-12-15
2008-03-11
Fourson, George R. (Department: 2823)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S082000, C438S099000, C438S725000, C438S780000
Reexamination Certificate
active
07341936
ABSTRACT:
A semiconductor device manufacturing method comprises the steps of forming a metal film (24) on an organic interlayer insulating film (22) formed over a semiconductor substrate to get a metal diffusion preventing metal carbide film (23) on a boundary between the organic interlayer insulating film (22) and the metal film (24), and leaving the metal carbide film (23) on the organic interlayer insulating film (22) by removing selectively the metal film (24) from the metal carbide film (23).
REFERENCES:
patent: 5973400 (1999-10-01), Murakami et al.
patent: 6187672 (2001-02-01), Zhao et al.
patent: 6592771 (2003-07-01), Yamanaka et al.
patent: 10-98011 (1998-04-01), None
patent: WO 01/15220 (2001-03-01), None
Office Action dated May 11, 2006, issued in corresponding Korean Application No. 10 2005 7000561.
Kimura Takahiro
Uchibori Chihiro
Fourson George R.
Fujitsu Limited
Garcia Joannie Adelle
Westerman, Hattori, Daniels & Adrian , LLP.
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