Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Ion implantation of dopant into semiconductor region
Reexamination Certificate
2006-08-15
2006-08-15
Wilson, Allan R. (Department: 2815)
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
Ion implantation of dopant into semiconductor region
C438S519000, C438S522000, C438S530000, C257SE21335
Reexamination Certificate
active
07091114
ABSTRACT:
Disclosed is a method for manufacturing a semiconductor device comprising implanting ions of an impurity element into a semiconductor region, implanting, into the semiconductor region, ions of a predetermined element which is a group IV element or an element having the same conductivity type as the impurity element and larger in mass number than the impurity element, and irradiating a region into which the impurity element and the predetermined element are implanted with light to anneal the region, the light having an emission intensity distribution, a maximum point of the distribution existing in a wavelength region of not more than 600 nm.
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Iinuma Toshihiko
Ito Takayuki
Suguro Kyoichi
Kabushiki Kaisha Toshiba
Wilson Allan R.
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