Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Reexamination Certificate
2005-07-26
2005-07-26
Thompson, Craig A. (Department: 2813)
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
Reexamination Certificate
active
06921718
ABSTRACT:
A semiconductor device includes a semiconductor substrate and an electrode disposed on a major surface of the semiconductor substrate. A via hole is formed on a center of the electrode so as to open from a surface of the electrode to a place under the surface of the semiconductor substrate. A via-hole foundation electrode for inhibiting diffusion from a metal layer is formed inside the via hole and on the surface of the electrode, a via-hole electrode is formed on the surface of the via-hole foundation electrode. A back via hole is formed on the back of the semiconductor substrate opposite to the major surface thereof, and opened from the back of the semiconductor substrate to the via-hole electrode. A back via-hole electrode is formed on the back of the semiconductor substrate including the inside of the back via hole.
REFERENCES:
patent: 6225651 (2001-05-01), Billon
patent: 6284644 (2001-09-01), Aug et al.
patent: 10-64923 (1998-03-01), None
Andoh Naoto
Hosogi Kenji
Ishida Takao
Harrison Monica D.
Leydig , Voit & Mayer, Ltd.
Mitsubishi Denki & Kabushiki Kaisha
Thompson Craig A.
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