Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-06-28
2011-06-28
Mandala, Victor (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S332000, C257SE29257, C257SE29260, C257SE27091
Reexamination Certificate
active
07968939
ABSTRACT:
A gate trench13is formed in a semiconductor substrate10. The gate trench13is provided with a gate electrode16formed over a gate insulating film14. A portion of the gate electrode16protrudes from the semiconductor substrate10, and a sidewall24is formed over a side wall portion of the protruding portion. A body trench25is formed in alignment with an adjacent gate electrode16. A cobalt silicide film28is formed over a surface of the gate electrode16and over a surface of the body trench25. A plug34is formed using an SAC technique.
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Kachi Tsuyoshi
Matsuura Hitoshi
Nakazawa Yoshito
Yatsuda Yuji
Mandala Victor
Miles & Stockbridge P.C.
Renesas Electronics Corporation
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