Semiconductor device and method of manufacturing the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having schottky gate

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

438622, 438926, H01L 21338

Patent

active

059465638

ABSTRACT:
There are provided: an isolation protruding upward from a semiconductor substrate in an active region; a gate electrode formed in the active region; and a pair of dummy electrodes formed to extend over the active region and the isolation and substantially in parallel with the gate electrode. Each of the gate electrode and dummy electrodes is composed of a lower film and an upper film. The lower films of the dummy electrodes are formed flush with the isolation and in contact with the side edges of the isolation. With the dummy electrodes, any gate electrode can be formed in a line-and-space pattern, so that the finished sizes of the gate electrode become uniform. This enables a reduction in gate length and therefore provides a semiconductor device of higher integration which is operable at a higher speed and substantially free from variations in finished size resulting from the use of different gate patterns.

REFERENCES:
patent: 4902646 (1990-02-01), Nakano
patent: 5225704 (1993-07-01), Wakamiya et al.
patent: 5278105 (1994-01-01), Eden et al.
patent: 5281555 (1994-01-01), Cho
patent: 5410161 (1995-04-01), Narita
patent: 5441915 (1995-08-01), Lee
patent: 5441916 (1995-08-01), Motonami

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and method of manufacturing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and method of manufacturing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method of manufacturing the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2428661

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.