Semiconductor device and method of manufacturing a...

Active solid-state devices (e.g. – transistors – solid-state diode – Combined with electrical contact or lead – Of specified material other than unalloyed aluminum

Reexamination Certificate

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Details

C257S760000, C257S774000, C257S751000, C257SE23144, C257SE23161, C257SE23167

Reexamination Certificate

active

11048929

ABSTRACT:
A semiconductor device200comprises a SiCN film202formed on a semiconductor substrate (not shown), a first SiOC film204formed thereon, a SiCN film208formed thereon, a second SiOC film210formed thereon, a SiO2film212and a SiCN film214formed thereon. The first SiOC film204has a barrier metal layer216and via218formed therein, and the second SiOC film210has a barrier metal layer220and wiring metal layer222formed therein. Carbon content of the second SiOC film210is adjusted larger than that of the first SiOC film204. This makes it possible to improve adhesiveness of the insulating interlayer with other insulating layers, while keeping a low dielectric constant of the insulating interlayer.

REFERENCES:
patent: 6340435 (2002-01-01), Bjorkman et al.
patent: 6407011 (2002-06-01), Ikeda et al.
patent: 6472306 (2002-10-01), Lee et al.
patent: 6756674 (2004-06-01), Catabay et al.
patent: 2004/0155340 (2004-08-01), Owada et al.
patent: 2004/0201108 (2004-10-01), Kanamura
patent: 2002-203899 (2002-07-01), None

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