Semiconductor device and method of manufacture thereof

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer

Reexamination Certificate

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C438S165000, C438S635000, C438S770000, C438S911000, C438S966000, C438S508000, C257SE21284, C257SE21301

Reexamination Certificate

active

07425480

ABSTRACT:
A method of manufacturing a MOS transistor incorporating a silicon oxide film serving as a gate insulating film and containing nitrogen and a polycrystalline silicon film serving as a gate electrode and containing a dopant and arranged such that the gate electrode is formed on the gate electrode insulating film, and an oxidation process using ozone is performed to sufficiently round the shape of the lower edge of the gate electrode.

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