Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation
Reexamination Certificate
2007-12-25
2007-12-25
Smith, Matthew (Department: 2823)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
Insulated gate formation
C438S585000, C438S942000, C438S947000, C216S041000, C257SE21240, C257SE21241, C257SE21432, C257SE21487, C257SE21158
Reexamination Certificate
active
11790033
ABSTRACT:
A method of manufacturing a MOS transistor incorporating a silicon oxide film serving as a gate insulating film and containing nitrogen and a polycrystalline silicon film serving as a gate electrode and containing a dopant and arranged such that the gate electrode is formed on the gate electrode insulating film, and an oxidation process using ozone is performed to sufficiently round the shape of the lower edge of the gate electrode.
REFERENCES:
patent: 5330935 (1994-07-01), Dobuzinsky et al.
patent: 5412246 (1995-05-01), Dobuzinsky et al.
patent: 5602048 (1997-02-01), Komori et al.
patent: 5620910 (1997-04-01), Teramoto
patent: 5646054 (1997-07-01), Rhee
patent: 5693578 (1997-12-01), Nakanishi et al.
patent: 5693974 (1997-12-01), Hsu et al.
patent: 5907183 (1999-05-01), Takeuchi
patent: 5917221 (1999-06-01), Takemura
patent: 5959329 (1999-09-01), Tomita et al.
patent: 6251763 (2001-06-01), Inumiya
patent: 6414352 (2002-07-01), Hisamune
patent: 6707120 (2004-03-01), Aminzadeh et al.
patent: 2006/0006478 (2006-01-01), Kanegae et al.
patent: 07-183513 (1995-07-01), None
patent: 08-250720 (1996-09-01), None
patent: 09-148543 (1997-06-01), None
patent: 10-32328 (1998-02-01), None
patent: 10-163197 (1998-06-01), None
patent: 10-223771 (1998-10-01), None
Landau, L.D. et al., “Electrodynamics of Continuous Media,” vol. 8, in Course of Theoretical Physics, Pergamon Press, 1960 (first English edition, 1960 reprinted 1963, 1975, 1981) (Library of Congress Catalog Card: 60-14731), pp. 110 and 111.
Office Action, Japanese Application No. 2000-122018, dated May 14, 2004, and English language translation.
Wolf et al. “Silicon Processing for the VLSI Era,” vol. 1, Lattice Press, 1986, pp. 161-238.
Ozawa Yoshio
Suizu Yasumasa
Tsunashima Yoshitaka
Pham Thanh Van
Smith Matthew
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