Semiconductor device and method of manufacture

Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Including isolation structure

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S353000, C438S357000, C438S359000, C438S360000, C438S369000

Reexamination Certificate

active

06900105

ABSTRACT:
In a semiconductor manufacturing method, an emitter region (211) and a base enhancement region (207) are formed to provide linear voltage, capacitance and low resistance characteristics. In the manufacturing method, a semiconductor device (200) is formed on a silicon substrate layer (101) with an epitaxial layer (203). Trenches (233) are cut into the epitaxial layer (203) and filled with oxide (601) to provide reduced junction capacitance and reduced base resistance. The emitter region (211) and the base enhancement region (207) are simultaneously formed through an anneal process.

REFERENCES:
patent: 5101256 (1992-03-01), Harame et al.
patent: 5108783 (1992-04-01), Tanigawa et al.
patent: 5374845 (1994-12-01), Havemann
patent: 5480815 (1996-01-01), Watanabe
patent: 5796157 (1998-08-01), Fallico et al.
patent: 5798561 (1998-08-01), Sato
patent: 5982022 (1999-11-01), Violette
patent: 6064106 (2000-05-01), Shishido et al.
patent: 6156594 (2000-12-01), Gris
patent: 6265747 (2001-07-01), Suzuki
patent: 6287930 (2001-09-01), Park
patent: 6388307 (2002-05-01), Kondo et al.
patent: 11-312687 (1999-11-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and method of manufacture does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and method of manufacture, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method of manufacture will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3373845

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.