Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Including isolation structure
Reexamination Certificate
2005-05-31
2005-05-31
Nadav, Ori (Department: 2811)
Semiconductor device manufacturing: process
Forming bipolar transistor by formation or alteration of...
Including isolation structure
C438S353000, C438S357000, C438S359000, C438S360000, C438S369000
Reexamination Certificate
active
06900105
ABSTRACT:
In a semiconductor manufacturing method, an emitter region (211) and a base enhancement region (207) are formed to provide linear voltage, capacitance and low resistance characteristics. In the manufacturing method, a semiconductor device (200) is formed on a silicon substrate layer (101) with an epitaxial layer (203). Trenches (233) are cut into the epitaxial layer (203) and filled with oxide (601) to provide reduced junction capacitance and reduced base resistance. The emitter region (211) and the base enhancement region (207) are simultaneously formed through an anneal process.
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Balda Raymond J.
Freeman, Jr. John L.
Johnsen Robert J.
Petrucci, Jr. Joseph L.
Pryor Robert A.
Freescale Semiconductor Inc.
Nadav Ori
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