Semiconductor device and method of forming double-sided...

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Making plural separate devices

Reexamination Certificate

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C438S113000, C438S675000, C438S667000, C257S620000

Reexamination Certificate

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07666711

ABSTRACT:
A semiconductor device is made by creating a gap between semiconductor die on a wafer. An insulating material is deposited in the gap. A first portion of the insulating material is removed from a first side of the semiconductor wafer to form a first notch. The first notch is less than a thickness of the semiconductor die. A conductive material is deposited into the first notch to form a first portion of the conductive via within the gap. A second portion of the insulating material is removed from a second side of the semiconductor wafer to form a second notch. The second notch extends through the insulating material to the first notch. A conductive material is deposited into the second notch to form a second portion of the conductive via within the gap. The semiconductor wafer is singulated through the gap to separate the semiconductor die.

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patent: 6243945 (2001-06-01), Fujimoto et al.
patent: 6831367 (2004-12-01), Sekine
patent: 6908856 (2005-06-01), Beyne et al.
patent: 2006/0118510 (2006-06-01), Fujii
patent: 2007/0262464 (2007-11-01), Watkins et al.
patent: 2008/0096321 (2008-04-01), Lin et al.
patent: 2008/0174006 (2008-07-01), Fuchinoue
patent: 2008/0194060 (2008-08-01), Shimanuki
patent: 2008/0277793 (2008-11-01), Noma et al.
patent: 2001-298118 (2001-10-01), None

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