Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2009-06-30
2011-10-11
Wojciechowicz, Edward (Department: 2895)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S430000, C438S587000, C438S637000, C438S638000, C438S700000, C438S745000
Reexamination Certificate
active
08034714
ABSTRACT:
Provided are a semiconductor device and a method of fabricating the semiconductor memory device. A contact plug is formed by wet etching. An aspect ratio of SAC is decreased and SAC fail is reduced so that a process margin is secured. The semiconductor device includes a semiconductor substrate comprising an active region and a device isolation layer defining the active region, a conductive pattern formed on the semiconductor substrate, and a nitride layer formed on the semiconductor substrate perpendicularly to the conductive pattern.
REFERENCES:
patent: 100756807 (2007-08-01), None
patent: 1020080084064 (2008-09-01), None
patent: 1020080088909 (2008-10-01), None
Hynix / Semiconductor Inc.
Wojciechowicz Edward
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