Semiconductor device and method for measuring analog channel...

Details Semiconductor device and method for measuring analog channel... Semiconductor device and method for measuring analog channel...

2011-03-01

2011-03-01

Nguyen, Hoai-An D (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C257S048000

Reexamination Certificate

active

07898269

ABSTRACT:
A semiconductor device and a method for measuring an analog channel resistance thereof are provided. The semiconductor device includes a substrate, a gate insulating layer and a gate formed on the substrate, a source and a drain formed in the substrate and at both sides of the gate, a source sense connected to the source, and a drain sense connected to the drain.

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patent: 2002/0190258 (2002-12-01), Harada et al.
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