Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2011-01-04
2011-01-04
Garber, Charles D (Department: 2812)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
Reexamination Certificate
active
07863119
ABSTRACT:
It is made possible to provide a method for manufacturing a semiconductor device that has a high-quality insulating film in which defects are not easily formed, and experiences less leakage current. A method for manufacturing a semiconductor device, includes: forming an amorphous silicon layer on an insulating layer; introducing oxygen into the amorphous silicon layer; and forming a silicon oxynitride layer by nitriding the amorphous silicon layer having oxygen introduced thereinto.
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Office Action issued by the Chinese Patent Office on Feb. 5, 2010, for Chinese Application No. 200910004862.0 and English translation thereof.
Matsushita Daisuke
Mitani Yuuichiro
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Garber Charles D
Kabushiki Kaisha Toshiba
Stevenson Andre′ C
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