Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Ion implantation of dopant into semiconductor region
Reexamination Certificate
2006-04-06
2010-02-09
Booth, Richard A. (Department: 2812)
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
Ion implantation of dopant into semiconductor region
C438S529000
Reexamination Certificate
active
07659188
ABSTRACT:
The present invention provides a method for manufacturing a semiconductor device which includes a step of forming one optional impurity region in a semiconductor substrate at a place apart from the surface thereof, and in the method described above, ion implantation is performed a plurality of times while the position of an end portion of a mask pattern used for ion implantation is changed.
REFERENCES:
patent: 4920065 (1990-04-01), Chin et al.
patent: 5155061 (1992-10-01), O'Connor et al.
patent: 10-199993 (1998-07-01), None
patent: 2003-347541 (2003-12-01), None
Machine translation of JP 2003-347541.
Booth Richard A.
Fujitsu Microelectronics Limited
Westerman Hattori Daniels & Adrian LLP
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