Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2008-06-06
2010-11-02
Ha, Nathan W (Department: 2814)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C257SE21614
Reexamination Certificate
active
07824971
ABSTRACT:
A semiconductor device includes a PMOS transistor of a peripheral circuit region. The PMOS transistor is formed over a silicon germanium layer to have a compressive strain structure, thereby increasing hole mobility of a channel region in operation of the device. The semiconductor device may include a second active region including a silicon layer connected to a first active region of a semiconductor substrate, a silicon germanium layer formed over the silicon layer expected to be a PMOS region, and a PMOS gate formed over the silicon germanium layer.
REFERENCES:
patent: 5470776 (1995-11-01), Ryou
patent: 6365943 (2002-04-01), Gardner et al.
patent: 2004/0065884 (2004-04-01), Bhattacharyya
patent: 2004/0178406 (2004-09-01), Chu
patent: 2007/0181953 (2007-08-01), Lyu et al.
patent: 2008/0251856 (2008-10-01), Zhu et al.
patent: 2009/0146246 (2009-06-01), Hwang et al.
patent: 2009/0218628 (2009-09-01), Hwang
patent: 2009/0218635 (2009-09-01), Hwang
patent: 10-2006-0135124 (2006-12-01), None
patent: 2007/018495 (2007-02-01), None
Notice of Rejection for Korean Patent Application No. 10-2008-0018877, dated Jun. 30, 2009.
Ha Nathan W
Hynix / Semiconductor Inc.
Marshall & Gerstein & Borun LLP
LandOfFree
Semiconductor device and method for manufacturing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor device and method for manufacturing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method for manufacturing the same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4184348