Semiconductor device and method for manufacturing the same

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C977S742000

Reexamination Certificate

active

07998850

ABSTRACT:
Disclosed herein are a semiconductor device and a method for manufacturing the same. The method includes forming a gate structure using a carbon nano tube (CNT). In order to prevent reduction of the gate resistance and the short channel effect, a CNT gate having a grown CNT pattern with a half-cylinder shape is formed over a recess of a semiconductor substrate. The CNT gate has the same effect as a recess gate, and can prevent the short channel effect, improve the speed, and the lower power characteristic of semiconductor devices.

REFERENCES:
patent: 7084507 (2006-08-01), Awano
patent: 2003/0011036 (2003-01-01), Bethune et al.
patent: 2004/0016928 (2004-01-01), Ravi et al.
patent: 2004/0023431 (2004-02-01), Wang et al.
patent: 10-261659 (1998-09-01), None
patent: 10-2006-0023064 (2006-03-01), None
patent: 10-2006-0029547 (2006-04-01), None
patent: 10-2007-0117666 (2007-12-01), None
M. Quirk et al., “Semiconductor manufacturing technology”, 2001, Printice-Hall. Inc, pp. 435-445, Table 16.5).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor device and method for manufacturing the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor device and method for manufacturing the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor device and method for manufacturing the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2710809

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.