Semiconductor device manufacturing: process – Making regenerative-type switching device – Having structure increasing breakdown voltage
Reexamination Certificate
2011-01-04
2011-01-04
Lee, Calvin (Department: 2892)
Semiconductor device manufacturing: process
Making regenerative-type switching device
Having structure increasing breakdown voltage
C257S409000, C257S495000
Reexamination Certificate
active
07863110
ABSTRACT:
A semiconductor device includes a device isolation layer on a semiconductor substrate defining an active region in the semiconductor substrate, a low voltage well of a first conductivity type in the active region of the semiconductor substrate, a high voltage impurity region of a second conductivity type in the active region of the semiconductor substrate, the high voltage impurity region positioned in an upper portion of the low voltage well, a high concentration impurity region of the second conductivity type within the high voltage impurity region and spaced apart from the device isolation layer, and a floating impurity region of the first conductivity type between the device isolation layer and the high concentration impurity region, the floating impurity region being a portion of an upper surface of the active region.
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Hong Eun-Mi
Jang Kong-Sam
Kim Kwang-tae
Park Ji-hoon
Yu Tea-Kwang
Lee Calvin
Lee & Morse P.C.
Samsung Electronics Co,. Ltd.
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