Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – Insulated gate formation
Reexamination Certificate
2006-12-28
2009-08-11
Dang, Phuc T (Department: 2892)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
Insulated gate formation
C438S303000, C438S587000
Reexamination Certificate
active
07572720
ABSTRACT:
A semiconductor device includes a substrate, first, second, and third gate lines disposed over the substrate, the first and second gate lines defining a first trench with a first aspect ratio, the second and third gate lines defining a second trench with a second aspect ratio, a first insulating layer formed to decrease the first and second aspect ratios, and a second insulating layer disposed over the first insulating layer to fill the first and second trenches.
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patent: 2002/0132439 (2002-09-01), Norstrom et al.
patent: 10-2002-0074999 (2002-10-01), None
patent: 10-2004-0059445 (2004-07-01), None
Han Sang-Yeop
Won Se-Ra
Dang Phuc T
Hynix / Semiconductor Inc.
Townsend and Townsend / and Crew LLP
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