Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent
1996-01-23
1999-11-30
Saadat, Mahshid
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
257467, 257470, 324763, 324765, H01L 2358, H01L 31058, G01R 3102, G01R 3126
Patent
active
059947152
ABSTRACT:
An integrated circuit testing device and method for verifying functionality of an integrated circuit semiconductor device employs an operation checking circuit at an input/output of an integrated circuit and a thermally sensitive resin layer applied on the operation checking circuit unit. A transistor is used as a heat generating element for identifying abnormalities determined during evaluation of the integrated circuits such that when an abnormality is detected, the transistor receives a large current flow causing heat to be dissipated which in turn causes a change in the color of the thermally sensitive resin.
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Saadat Mahshid
Sony Corporation
Wilson Allan R.
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